MTSE 6625 - Advanced Electron and Ion Microscopy Laboratory

1 hour

Gives students with existing electron and ion microscopy backgrounds the opportunity to gain hands-on knowledge of advanced analytical microscopy techniques. Specific advanced topics include focused ion beam specimen preparation and patterning, Z-contrast scanning transmission electron microscopy, advanced diffraction and defect analysis, electron energy loss spectroscopy and energy filtered imaging in the transmission electron microscope, high resolution transmission electron microscopy imaging and 3D imaging of nanostructures using focused ion beam and tilt-series transmission electron microscopy. Specific applications of these techniques to modern problems in materials science are stressed.

Prerequisite(s): MTSE 6600, MTSE 6605. MTSE 6620 (may be taken concurrently).