MTSE 4620 - Scanning Electron and Ion Microscopy

3 hours

Introduction to the theoretical and applied aspects of scanning electron and ion microscopy. Introduces a variety of analytical techniques that may be exploited when characterizing engineering materials using scanning electron and ion microscopes, including imaging, energy dispersive X-ray microanalysis, electron backscattered diffraction and focused ion beam techniques.

Prerequisite(s): MTSE 3000 and MTSE 3020.